User Meetings und Workshops
Insiderwissen und Come-together! Neben der internen Akademie bietet JEOL zu verschiedenen Themengebieten auch User Meetings und Workshops an. So wird in jeder Kundengruppe die effiziente Vernetzung gefördert. Als internationales Format hat sich zusätzlich die MICROCOM etabliert, eine internationale Digitalkonferenz, welche Wissenschaftler aus aller Welt an den digitalen runden Tisch holt.
Nutzen auch Sie das Experten- und User-Wissen und melden sich gleich zu den nächsten Meetings an!
Workshop – Multimodal material analysis with the SEM
We are pleased to invite you to our hands-on workshop, providing an up-to-date overview of the latest developments in analytical and microscopy techniques.
Company and customer presentations will showcase integrated investigation strategies that deliver a complete “picture” of your sample — from SEM, EDS, WDS, Auger electron spectroscopy (AES), and soft X-ray emission spectroscopy (SXES) to co-localized Raman spectroscopy in the SEM. A special highlight will be our hands-on sessions at the demo systems, where you will have the opportunity to interact directly with experts and discuss your questions about the systems and methods. Throughout the workshop, you will experience plenty of networking opportunities, and inspiring professional discussions on modern materials characterization.
Why Attend?
> Hands-on learning: Experience state-of-the-art equipment and explore advanced spectroscopy & SEM applications.
> Expert insights: Learn from leading specialists and gain deeper understanding of these cutting-edge techniques.
> Networking opportunities: Engage with fellow researchers and professionals in a focused and collaborative environment.
Workshop Details:
Date: 28 – 29 January 2026
Venue: JEOL, Gute Änger 30, 85356 Freising
Capacity: Only 30 spots available
Participation: Attendance is free of charge
Preliminary Agenda:
Wednesday, 28th January 2026
- 09:45 Welcome & registration
- 10:00 Workshop starts
- 12:00 Lunch break
- 13:00 Workshop
- 15:00 Coffee break
- 18:00 End of the first workshop day
- 18:15 Dinner @JEOL (Germany) GmbH
Thursday, 29th January 2026
- 09:00 Workshop
- 10:30 Coffee break
- 12:00 End of the workshop
- 12:15 Farewell Lunch
Current topics presented by our speakers:
- Overcoming limitations of conventional EDS systems – use cases for windowless EDS, WDS and SXES detectors
- Optimised standardless EDS-quantification with WDS-supported peak deconvolution
- All-in-one co-localized Lithium detection on graphite by Soft X-ray and Raman spectroscopy, as well as composition-by-difference via energy dispersive spectroscopy in a scanning electron microscope
- Beyond SEM: unlocking tribological layers by advanced surface and interface analysis. A necessary combination of state-of-the-art, complementary analysis techniques
- Micro X-ray fluorescence (µXRF) analysis on the microprobe
- Unlocking multi-scale insights with Raman spectroscopy inside SEM
- Raman spectroscopy, Raman imaging and SERS applications for the investigation of polymer blends, carbon based polymer composites and nanoassemblies and for the analysis of microplastics in environmental and food samples
- Neural network-aided Raman imaging for SiC quality management
- Fast, high-resolution analyses using energy-filtered SEM imaging – a sneak preview of a new generation of Auger-SEMs
Additional programme highlights:
- Practical sessions using JEOL and RENISHAW demo instruments
(If you would like to bring samples for us to measure, please send us an email) - Dinner @JEOL (Germany) GmbH
Please note that registration closes on 16 January 2026.